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Studying Next-Generation Battery and LED Materials at the Canadian Light Source

Fri., Oct. 28, 2016 3:00 p.m. - Fri., Oct. 28, 2016 4:00 p.m.

Location: CL 130

AbstractThe discovery of new functional materials is key to the development of technologies for improving society's energy efficiency. Soft x-ray spectroscopy is an experimental technique that provides a unique perspective on many important material properties. When combined with first principles electronic structure calculations, everything from the bulk band gap, to site-specific charge densities can be determined and understood. This talk will look at the application of these techniques to several technologically important nitrides and oxides, highlighting how they can provide the understanding of a material's structure-property relationships that is needed to guide the search for new functional materials.

Speaker: Thomas Tolhurst was awarded a B.Sc. Physics and Mathematics from the University of Regina in 2010, a M.Sc. Physics also from the University of Regina in 2013, and is currently a Ph.D. candidate at the University of Saskatchewan.